AIEEE Physics Syllabus II

This page lists the detailed AIEEE Mathematics Syllabus 2012. AIEEE Mathematics Syllabus of Units 13-20 are given here which includes Magnetism, Optics, Electromagnetic Waves, and Communication Studies.

AIEEE Physics Syllabus 2012 Units 13-20

13. MAGNETIC EFFECTS OF CURRENT AND MAGNETISM
Biot – Savart law and its application to current carrying circular loop.Ampere’s law and its applications to infinitely long current carrying straight wire and solenoid. Force on a moving charge in uniform magnetic and electric fields. Cyclotron. Force on a current-carrying conductor in a uniform magnetic field. Force between two parallel current-carrying conductors-definition of ampere. Torque experienced by a current loop in uniform magnetic field; Moving coil galvanometer, its current sensitivity and conversion to ammeter and voltmeter. Current loop as a magnetic dipole and its magnetic dipole moment. Bar magnet as an equivalent solenoid, magnetic field lines; Earth’s magnetic field and magnetic elements. Para-, dia- and ferro- magnetic substances. Magnetic susceptibility and permeability, Hysteresis, Electromagnets and permanent magnets.

14. ELECTROMAGNETIC INDUCTION AND ALTERNATING CURRENTS
Electromagnetic induction; Faraday’s law, induced emf and current; Lenz’s Law, Eddy currents. Self and mutual inductance. Alternating currents, peak and rms value of alternating current/ voltage; reactance and impedance; LCR series circuit, resonance; Quality factor, power in AC circuits, wattless current. AC generator and transformer.

15.  ELECTROMAGNETIC WAVES
Electromagnetic waves and their characteristics. Transverse nature of electromagnetic waves.
Electromagnetic spectrum (radio waves, microwaves, infrared, visible, ultraviolet, X-rays, gamma rays). Applications of e.m. waves.

16. OPTICS
Reflection and refraction of light at plane and spherical surfaces, mirror formula, Total internal reflection and its applications, Deviation and Dispersion of light by a prism, Lens Formula, Magnification, Power of a Lens, Combination of thin lenses in contact, Microscope and Astronomical Telescope (reflecting and refracting) and their magnifying powers. Wave opticswavefront and Huygens’ principle, Laws of reflection and refraction using Huygen’s principle. Interference, Young’s double slit experiment and expression for fringe width, coherent sources and sustained interference of light. Diffraction due to a single slit, width of central maximum. Resolving power of microscopes and astronomical telescopes, Polarisation, plane polarized light; Brewster’s law, uses of plane polarized light and Polaroids.

17. DUAL NATURE OF MATTER AND RADIATION
Dual nature of radiation. Photoelectric effect, Hertz and Lenard’s observations; Einstein’s photoelectric equation; particle nature of light. Matter waves-wave nature of particle, de Broglie relation. Davisson-Germer experiment.

18. ATOMS AND NUCLEI
Alpha-particle scattering experiment; Rutherford’s model of atom; Bohr model, energy levels, hydrogen spectrum.
Composition and size of nucleus, atomic masses, isotopes, isobars; isotones. Radioactivity-alpha, beta and gamma particles/rays and their properties; radioactive decay law. Mass-energy relation, mass defect; binding energy per nucleon and its variation with mass number, nuclear fission and fusion.

19. ELECTRONIC DEVICES
Semiconductors; semiconductor diodeI-V characteristics in forward and reverse bias; diode as a rectifier; I-V characteristics of LED, photodiode, solar cell and Zener diode; Zener diode as a voltage regulator. Junction transistor, transistor action, characteristics of a transistor; transistor as an amplifier (common emitter configuration) and oscillator. Logic gates (OR, AND, NOT, NAND and NOR). Transistor as a switch.       

20. COMMUNICATION SYSTEMS
Propagation of electromagnetic waves in the atmosphere; Sky and space wave propagation, Need for modulation, Amplitude and Frequency Modulation, Bandwidth of signals, Bandwidth of Transmission medium, Basic Elements of a Communication System (Block Diagram only).

SECTION-B

21. EXPERIMENTAL SKILLS

1. Familiarity with the basic approach and observations of the experiments and activities
2. Vernier callipers-its use to measure internal and external diameter and depth of a vessel.
3. Screw gauge-its use to determine thickness/diameter of thin sheet/wire.
4. Simple Pendulum-dissipation of energy by plotting a graph between square of amplitude and time.
5. Metre Scale – mass of a given object by principle of moments.
6. Young’s modulus of elasticity of the material of a metallic wire.
7. Surface tension of water by capillary rise and effect of detergents.
8. Co-efficient of Viscosity of a given viscous liquid by measuring terminal velocity of a given spherical body.
9. Plotting a cooling curve for the relationship between the temperature of a hot body and time.
10. Speed of sound in air at room temperature using a resonance tube.
11. Specific heat capacity of a given (i) solid and (ii) liquid by method of mixtures.
12. Resistivity of the material of a given wire using metre bridge.
13. Resistance of a given wire using Ohm’s law.
14. Potentiometer –

15.   Comparison of emf of two primary cells.
      Determination of internal resistance of a cell.

16. Resistance and figure of merit of a galvanometer by half deflection method.
    Focal length of: Convex mirror
    Concave mirror, and
    Convex lens
17. using parallax method. Plot of angle of deviation vs angle of incidence for a triangular prism.
    Refractive index of a glass slab using a travelling microscope.
    Characteristic curves of a p-n junction diode in forward and reverse bias.
    Characteristic curves of a Zener diode and finding reverse break down voltage.
    Characteristic curves of a transistor and finding current gain and voltage gain.
    Identification of Diode, LED, Transistor, IC, Resistor, Capacitor from mixed collection of such items.
    Using multimeter to:

• Identify base of a transistor
• Distinguish between npn and pnp type transistor
• See the unidirectional flow of current in case of a diode and an LED.
• Check the correctness or otherwise of a given electronic component (diode, transistor or IC).